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Randomized Benchmarking using Non-Destructive Readout in a 2D Atom Array

  • arXiv (Cornell University)
  • Cornell University
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Abstract

Neutral atoms are a promising platform for scalable quantum computing, however prior demonstration of high fidelity gates or low-loss readout methods have employed restricted numbers of qubits. Using randomized benchmarking of microwave-driven single-qubit gates, we demonstrate average gate errors of $7(2)\times10^{-5}$ on a 225 site atom array using conventional, destructive readout. We further demonstrate a factor of 1.7 suppression of the primary measurement errors via low-loss, non-destructive and state-selective readout on 49 sites whilst achieving gate errors of $2(9)\times10^{-4}$.

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Publication details

DOI
10.48550/arxiv.2301.10510
OpenAlex
W4318239581
Document type
preprint
Language
EN
Source
arXiv (Cornell University)
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