ملف الباحث

Yong Rui

ورقة واحدة في مجموعة PaperMetrix

المنشورات

أوراق هذا المؤلف

  1. Implicit Relative Labeling-Importance Aware Multi-Label Metric Learning

    2025 · Proceedings of the AAAI Conference on Artificial Intelligence

    Multi-label metric learning, as an extension of metric learning to multi-label scenarios, aims to learn better similarity metrics for objects with rich semantics. Existing multi-label metric learning approaches employ the common assumption of equal labeling-importance, …