Debayan Das

EM-X-DL: Efficient Cross-Device Deep Learning Side-Channel Attack with Noisy EM Signatures

2020 · arXiv (Cornell University)

This work presents a Cross-device Deep-Learning based Electromagnetic (EM-X-DL) side-channel analysis (SCA), achieving >90% single-trace attack accuracy on AES-128, even in the presence of significantly lower signal-to-noise ratio (SNR), compared to the previous works. With …