ملف الباحث
Mohamed Baker Alawieh
ورقة واحدة في مجموعة PaperMetrix
المنشورات
أوراق هذا المؤلف
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ADAPT: An Adaptive Machine Learning Framework with Application to Lithography Hotspot Detection
2021
Recent advances in machine learning have introduced a new lens to envision novel solutions in many research domains and the Electronic Design Automation field is an evident example. Today, Machine Learning research is penetrating into …