ملف الباحث

Yuma Torikoshi

ورقة واحدة في مجموعة PaperMetrix

المنشورات

أوراق هذا المؤلف

  1. Sensitive Region-based Metamorphic Testing Framework using Explainable AI

    2023 · arXiv (Cornell University)

    Deep Learning (DL) is one of the most popular research topics in machine learning and DL-driven image recognition systems have developed rapidly. Recent research has employed metamorphic testing (MT) to detect misclassified images. Most of …