ملف الباحث
Fedor Getman
ورقة واحدة في مجموعة PaperMetrix
المنشورات
أوراق هذا المؤلف
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Artificial-Intelligence Empowered Universal Metrology Optical Camera
2023
We introduce a metrology platform that employs artificial intelligence in hardware through optical metasurfaces. We experimentally demonstrate the measurement of thin film thickness and refractive index maps with nanometer accuracy using this platform.