ملف الباحث

Fedor Getman

ورقة واحدة في مجموعة PaperMetrix

المنشورات

أوراق هذا المؤلف

  1. Artificial-Intelligence Empowered Universal Metrology Optical Camera

    2023

    We introduce a metrology platform that employs artificial intelligence in hardware through optical metasurfaces. We experimentally demonstrate the measurement of thin film thickness and refractive index maps with nanometer accuracy using this platform.