Spectral characterization of SPDC-based single-photon sources for quantum key distribution

Abstract In our laboratory, we employ two biphoton sources for quantum key distribution. The first is based on cw parametric down-conversion of photons at 404 nm in PPKTP waveguide chips, while the second is based on the pulsed parametric down-conversion of 775 nm photons in PPLN waveguides. The spectral characterization is important for the determination of certain side-channel attacks. A Hong-Ou-Mandel experiment employing the first photon source revealed a complex structure of the common Hong-Ou-Mandel dip. By measuring the spectra of the single photons at 808 nm, we were able to associate these structures to the superposition of different transverse modes of the pump photons in our waveguide chips. The pulsed source was characterized by means of single-photon spectra measured by a sensitive spectrum analyzer as well as dispersion-based measurements. Finally, we also describe Hong-Ou-Mandel experiments using the photons from the second source.