preprint
Open access
Randomized Benchmarking using Non-Destructive Readout in a 2D Atom Array
Research footprint
At a glance
- Citations
- 2
- References
- 0
- Comments
- 0
Paper overview
Abstract
Neutral atoms are a promising platform for scalable quantum computing, however prior demonstration of high fidelity gates or low-loss readout methods have employed restricted numbers of qubits. Using randomized benchmarking of microwave-driven single-qubit gates, we demonstrate average gate errors of $7(2)\times10^{-5}$ on a 225 site atom array using conventional, destructive readout. We further demonstrate a factor of 1.7 suppression of the primary measurement errors via low-loss, non-destructive and state-selective readout on 49 sites whilst achieving gate errors of $2(9)\times10^{-4}$.
Record transparency
Publication details
- DOI
- 10.48550/arxiv.2301.10510
- OpenAlex
- W4318239581
- Document type
- preprint
- Language
- EN
- Source
- arXiv (Cornell University)
- Last metadata update
Comments
Log in to join the discussion.