conference-paper

Enhancing Defect Prediction with Static Defect Analysis

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Abstract

In the software development process, how to develop better software at lower cost has been a major issue of concern. One way that helps is to find more defects as early as possible, on which defect prediction can provide effective guidance. The most popular defect prediction technique is to build defect prediction models based on machine learning. To improve the performance of defect prediction model, selecting appropriate features is critical. On the other hand, static analysis is usually used in defect detection. As static defect analyzers detects defects by matching some well-defined "defect patterns", its result is useful for locating defects. However, defect prediction and static defect analysis are supposed to be two parallel areas due to the differences in research motivation, solution and granularity.

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Publication details

DOI
10.1145/2875913.2875922
OpenAlex
W2527889679
Document type
conference-paper
Language
EN
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