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Deepfake Detection: Analyzing Model Generalization Across Architectures, Datasets, and Pre-Training Paradigms

  • IEEE Access
  • Institute of Electrical and Electronics Engineers
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Abstract

As deepfake technology gains traction, the need for reliable detection systems is crucial. Recent research has introduced various deep learning-based detection systems, yet they exhibit limitations in generalizing effectively across diverse data distributions that differ from the training data. Our study focuses on understanding the generalization challenges by exploring specific aspects such as deep learning model architecture, pre-training strategy and datasets. Through a comprehensive comparative analysis, we evaluate multiple supervised and self-supervised deep learning models for deepfake detection. Specifically, we evaluate eight supervised deep learning architectures and two transformer-based models pre-trained using self-supervised strategies (DINO, CLIP) on four different deepfake detection benchmarks (FakeAVCeleb, CelebDF-V2, DFDC and FaceForensics++). Our analysis includes intra-dataset and inter-dataset evaluations, examining the best performing models, generalisation capabilities and impact of augmentations. We also investigate the trade-off between model size, efficiency and performance. Our main goal is to provide insights into the effectiveness of different deep learning architectures (transformers, CNNs), training strategies (supervised, self-supervised) and deepfake detection benchmarks. Through our extensive analysis, we established that Transformer models outperform CNN models in deepfake detection. Also, we show that FaceForensics++ and DFDC datasets equip models with comparably better generalisation capabilities, as compared to FakeAVCeleb and CelebDF-V2 datasets. Our analysis also show that image augmentations can be helpful in achieving better performance, at least for the Transformer models.

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Publication details

DOI
10.1109/access.2023.3348450
OpenAlex
W4390422207
Document type
article
Language
EN
Source
IEEE Access
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