Stefan Pechmann

Soft-Error Analysis of RRAM 1T1R Compute-In-Memory Core for Artificial Neural Networks

2024

This work analyses SEU-induced soft-errors in analog compute-in-memory cores using resistive random-access memory (RRAM) for artificial neural networks, where their bitcells utilize one-transistor-one-RRAM (1T1R) structure. This is modeled by combining the Stanford-PKU RRAM Model and …