Qizhou Wang

Artificial-Intelligence Empowered Universal Metrology Optical Camera

2023

We introduce a metrology platform that employs artificial intelligence in hardware through optical metasurfaces. We experimentally demonstrate the measurement of thin film thickness and refractive index maps with nanometer accuracy using this platform.

Learning to Augment Distributions for Out-of-Distribution Detection

2023 · arXiv (Cornell University)

Open-world classification systems should discern out-of-distribution (OOD) data whose labels deviate from those of in-distribution (ID) cases, motivating recent studies in OOD detection. Advanced works, despite their promising progress, may still fail in the open …