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Sentiment Classification using N-gram IDF and Automated Machine Learning

  • arXiv (Cornell University)
  • Cornell University
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We propose a sentiment classification method with a general machine learning framework. For feature representation, n-gram IDF is used to extract software-engineering-related, dataset-specific, positive, neutral, and negative n-gram expressions. For classifiers, an automated machine learning tool is used. In the comparison using publicly available datasets, our method achieved the highest F1 values in positive and negative sentences on all datasets.

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Publication details

DOI
10.48550/arxiv.1904.12162
OpenAlex
W2949648038
Document type
preprint
Language
EN
Source
arXiv (Cornell University)
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