Adi Wijaya

Two-Step Cluster Based Feature Discretization of Naive Bayes for Outlier Detection in Intrinsic Plagiarism Detection

2015 · Journal of Intelligent Systems

Intrinsic plagiarism detection is the task of analyzing a document with respect to undeclared changes in writing style which treated as outliers. Naive Bayes is often used to outlier detection. However, Naive Bayes has assumption …