Jatin Prakash

A Novel Data Augmentation Technique for Out-of-Distribution Sample Detection using Compounded Corruptions

2022 · arXiv (Cornell University)

Modern deep neural network models are known to erroneously classify out-of-distribution (OOD) test data into one of the in-distribution (ID) training classes with high confidence. This can have disastrous consequences for safety-critical applications. A popular …