Researcher profile
Yuma Torikoshi
1 paper in the PaperMetrix corpus
Publications
Papers by this author
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Sensitive Region-based Metamorphic Testing Framework using Explainable AI
2023 · arXiv (Cornell University)
Deep Learning (DL) is one of the most popular research topics in machine learning and DL-driven image recognition systems have developed rapidly. Recent research has employed metamorphic testing (MT) to detect misclassified images. Most of …